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174 item(s)/page
Hanwa R CDM Model HED-C5000R â€" Robotic Charged Device Model (CDM) ESD Test System W575 x D400 x H300 | Weight: 35 kg | Compact desktop size High...
PVA TePla VUE-250 P â€" C-Mode Scanning Acoustic Microscope (CSAM) The PVA TePla VUE-250 P is a state-of-the-art C-Mode Scanning Acoustic Microsco...
Hirayama HAST Chamber PC-422R8 â€" Highly Accelerated Stress Test System The Hirayama HAST PC-422R8 is a high-precision chamber designed for Highl...
Hanwa HED-G5000 ESD HBM 1024pins 6Bias Power Supplies Ultra Low Parasitic High Pin Count ESD Tester
Hanwa HED-G5000 ESD Tester â€" HBM/MM Model with 1024 Pins and 6 Bias Power Supplies The Hanwa HED-G5000 is a high-end ESD tester designed for adv...
Signatone 6"" Probe Station Prober
SpeedLine ACCEL MicroCel Centrifugal Cleaner System
Cascade 12000 200mm 8"""" Wafer Prober
Cascade 12000 200mm 8"""" Wafer Prober
Cascade 12000 200mm 8"""" Wafer Prober
SemiProbe SA-12 300mm Semiautomatic 12"""" Wafer Prober
Signatone C312-S Manual Wafer Prober 300mm
Signatone CM312 300mm Manual Wafer Prober With Isolation Table
Signatone CM100 6� Manual Wafer Prober Nickel Chuck
Rucker And Koll 5� Manual Prober
Micromanipulator 200MM 8060 Sub-Micron 8"""" Wafer Prober
Micromanipulator 8060 200mm Sub-Micron 8"""" Wafer Prober
Micromanipulator 8060 200mm Sub-Micron 8"""" Wafer Prober
Prober Solutions Micromanipulator 200mm 8�Wafer Prober w/ New Wave LCSII 532 System
Karl Suss P8 8"" 200mm Manual Wafer Prober
Sistema de sonda de obleas HF KLA 1007 de KLA Instruments Corporation, diseñado para pruebas de semiconductores y sondeo de obleas
Sensata / Qinex TCU-0536 Thermal Forcing System w/ Head
Sensata / Qinex TCU-0536 Thermal Forcing System w/ Head
Sensata / Qinex TCU-0534 Thermal Forcing System w/ Head
NI PXIe-1062Q Chassis with PXIe-8360, PXI-6259, PXIe-4154, PXI-4110 Modules
Schmidt Pneumatic Press Model 24-75-2K with PressControl 50 (2015)
Hirayama / HAST PC-422R9 Highly Accelerated Stress Test System 20hrs Used ONLY
Hirayama / HAST PC-422R9 Highly Accelerated Stress Test System 20hrs Used ONLY
Tel P12XLn 300mm 12"" Wafer Prober FULLY FUNCTIONAL
Tokyo Electron Limited TEL P8XL 200mm Room Hot Wafer Prober
Tel P8 Fully Automatic Wafer Prober
ELMAN EE_ATE Automated Test Equipment (ATE) System â€" 2020 â€" Italy
California Instruments 1201WP Frequency Changer 1200VA 47-500Hz Output
Brookfield DV-III Ultra Rheometer w/ DV-III+ Base Unit & Display
Agilent 54754A TDR Module 18GHz 4-Channel Differential
Agilent 16903A Logic Analysis System â€" 16900 Series
Tektronix TLA 704 / TLA 714Logic Analyzer
Agilent U2722A Source Measure Unit
Advantest D3286 Error Detector 3.2Gbps
Advantest D3186 Pulse Pattern Generator & Error Detector 3.2Gbps
Ion Torrent PGM Dx Personal Genome Machine Model 7469 â€" Thermo Fisher Scientific
Azimuth ACE 400WB/Wi-Fi MIMO Channel Emulator for Mobile WiMAX Wireless Testing
Tektronix TDS3054 500MHz 5GS/s 4-Channel Digital Phosphor Oscilloscope DPO
Tektronix TCPA300 + TCP312 AC/DC Current Probe System â€" 30A
Anritsu MP1653A Error Detector 0.05 - 3 GHz
Agilent 8960 Series 10 Wireless Communication Test Set, Model E5515C
Tektronix TCP312 Current Probe 30A DC/AC with Soft Case
LaserMike Diameter Measurement System by Techmet
Agilent 8960 E5515C Wireless Communication Test Set | Series 10
Q-Lab Calibration Kit - CT202 Thermometer, Radiometers & UC Sensors in Cases
Createch Rehder O? Permeometer Model 201T Oxygen Permeability Tester
Tektronix TDS 430A Two Channel 400MHz 100MS/s Digitizing Oscilloscope
KD Optics Type NT10A TEC Controller Issue 2.2 Software
Azimuth LTH-101 Laptop Test Head Enclosure
Tektronix TDS 744A Color Four Channel Digitizing Oscilloscope 500MHz 2GS/s
Reatum E-BMS-020 Signal Analyzer with USB & BNC Interface
Agilent 6628A System DC Powe Supply
Agilent 34401A 6 1/2 Digit Multimeter
HP 6628A System DC Powe Supply
HP 6628A System DC Powe Supply
HP 33120A 15MHz Function / Arbitrary Waveform Generator
Binocular Zoom Stereo Microscope with Flex Arm Stand 104B
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174 item(s)/page